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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27708

Title: Magnetization Configurations and Magnetization Reversal of Thin Submicron Permalloy Ellipses with Structural Defects
Authors: Ching-Ray Chang;Jyh-Shinn Yang
Contributors: NTOU:Institute of Optoelectronic Sciences
國立臺灣海洋大學:光電科學研究所
Keywords: Structural defects;patterned films;magnetization configuration;magnetization reversal;micro magnetic calculations
Date: 2008-06
Issue Date: 2011-10-21T02:33:02Z
Publisher: Journal of Nanoscience and Nanotechnology
Abstract: Abstract:We have studied the magnetic switching behavior of thin elliptical permalloy films with structural defects by micromagnetic simulations. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which alters the local equilibrium magnetization patterns and modifies the switching behavior of magnetization. In particular, for the case of voids close to the edge, the curling effect of voids is significant, and induces the occurrence of the multiple-stage modes of magnetization reversal, resulting in a high switching field.
Relation: 8(6), pp.2901-2904
URI: http://ntour.ntou.edu.tw/handle/987654321/27708
Appears in Collections:[光電科學研究所] 期刊論文

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