English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28326/40319
Visitors : 4086149      Online Users : 99
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27664

Title: Structural and optical characterization of single-phase γ-In2Se3 films with room-temperature photoluminescence
Authors: D. Y. Lyu;T. Y. Lin;T. W. Chang;S. M. Lan;T. N. Yang;C. C. Chiang;C. L. Chen;H. P. Chiang
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: InSe;MOCVD;Photoluminescence
Date: 2010-06-01
Issue Date: 2011-10-21T02:32:42Z
Publisher: Journal of Alloys and Compounds
Abstract: Abstract:The single-phase γ-In2Se3 films with red room-temperature photoluminescence (PL) have been realized by atmospheric metal-organic chemical vapor deposition at the temperature range of 350–500 °C. The crystal structure of the γ-In2Se3 films was determined by X-ray diffraction and Raman spectroscopy. From the temperature dependence of the free exciton line, the room-temperature energy gap of γ-In2Se3 films is found to be about 1.947 eV. At 10 K, the free exciton emissions was observed and located at 2.145 eV. The temperature dependence of the near band-edge emission in the temperature region of 10–300 K has been investigated. The measured peak energy of near band-edge emission redshifts by about 200 meV with increasing temperature from 10 to 300 K, and is expressed by, Eg(T) = 2.149 + ((−8.50 × 10−4)T2/(T + 75.5)) eV. This study was done to complete the reported information about γ-In2Se3 thin films.
PACS 81.05.Hd;81.15.Gh;78.55.Hx
Relation: 499(1), pp.104-107
URI: http://ntour.ntou.edu.tw/handle/987654321/27664
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback