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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27612

Title: High sensitivity surface plasmon resonance sensor based on phase interrogation at optimal incident wavelengths
Authors: Hai-Pang Chiang;Jing-Lun Lin;Zhi-Wei Chen
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: surface plasmon resonance;optical sensors;chemical sensors;refractive index measurement;light polarisation;light reflection
Date: 2006-04-03
Issue Date: 2011-10-21T02:32:23Z
Publisher: Applied Physics Letters
Abstract: Abstract:It is demonstrated that ultrahigh sensitivity of glucose refractive index measurement can be achieved via surface plasmon resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incident angle. Sensitivity with values down to the order of 10−8 is obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared to the previously reported values in the literature.
Relation: 88(14), pp.141105-1-141105-3
URI: http://ntour.ntou.edu.tw/handle/987654321/27612
Appears in Collections:[光電科學研究所] 期刊論文

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