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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27556

Title: The Effect of Structural Defects on Magnetic Switching in Thin Ferromagnetic Patterned Films
Authors: Ching-Ray Chang;Jyh-Shinn Yang
Contributors: NTOU:Institute of Optoelectronic Sciences
國立臺灣海洋大學:光電科學研究所
Keywords: Magnetic switching;micromagnetic simulations;patterned films;structural defects
Date: 2007-02
Issue Date: 2011-10-21T02:32:09Z
Publisher: IEEE Transactions on Magnetics(IEEE Trans. Magn.)
Abstract: Abstract:We have utilized micromagnetic simulations to study the effect of structural defects on the magnetic switching behavior of thin elliptical permalloy films. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which changes the local equilibrium magnetization configurations and alters the switching behavior of magnetization, leading to a large variation in switching fields. In particular, for the case of voids close to the edge, the curling effect of voids is significant and induces the occurrence of the multiple-stage magnetization reversal, leading to significantly large switching fields.
Relation: 43(2), pp.923-926
URI: http://ntour.ntou.edu.tw/handle/987654321/27556
Appears in Collections:[光電科學研究所] 期刊論文

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