English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28611/40649
Visitors : 621391      Online Users : 70
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27556

Title: The Effect of Structural Defects on Magnetic Switching in Thin Ferromagnetic Patterned Films
Authors: Ching-Ray Chang;Jyh-Shinn Yang
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Magnetic switching;micromagnetic simulations;patterned films;structural defects
Date: 2007-02
Issue Date: 2011-10-21T02:32:09Z
Publisher: IEEE Transactions on Magnetics(IEEE Trans. Magn.)
Abstract: Abstract:We have utilized micromagnetic simulations to study the effect of structural defects on the magnetic switching behavior of thin elliptical permalloy films. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which changes the local equilibrium magnetization configurations and alters the switching behavior of magnetization, leading to a large variation in switching fields. In particular, for the case of voids close to the edge, the curling effect of voids is significant and induces the occurrence of the multiple-stage magnetization reversal, leading to significantly large switching fields.
Relation: 43(2), pp.923-926
URI: http://ntour.ntou.edu.tw/handle/987654321/27556
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback