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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27553

Title: Terahertz response of GaN thin films
Authors: Tsong-Ru Tsai;Shi-Jie Chen;Chih-Fu Chang;Sheng-Hsien Hsu;Tai-Yuan Lin
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Spectroscopy;far infrared;Thin films;optical properties
Date: 2006-05-29
Issue Date: 2011-10-21T02:32:08Z
Publisher: Optics express
Abstract: Abstract:The indices of refraction, extinction constants and complex conductivities of the GaN film for frequencies ranging from 0.2 to 2.5 THz are obtained using THz time-domain spectroscopy. The results correspond well with the Kohlrausch stretched exponential model. Using the Kohlrausch model fit not only provides the mobility of the free carriers in the GaN film, but also estimates the relaxation time distribution function and average relaxation time.
Relation: 14(11), pp.4898-4907
URI: http://ntour.ntou.edu.tw/handle/987654321/27553
Appears in Collections:[光電科學研究所] 期刊論文

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