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Title: Reducing the critical switching current in the free layer of magnetic random access memory
Authors: Jyh-Shinn Yang;Ching-Ray Chang
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Micromagnetic simulation;Toggle-mode switching;Synthetic antiferromatic bilayer;MRAM
Date: 2006-09
Issue Date: 2011-10-21T02:32:02Z
Publisher: Journal of Magnetism and Magnetic Materials
Abstract: Abstract:The switching behavior of synthetic antiferromagnetic (SyAF) bilayers in a toggle magnetic random access memory is investigated by micromagnetism. The strength of exchange coupling between the two sublayers significantly modifies the switching behavior of SyAF bilayers. The critical switching current decreases with decreasing the exchange coupling, and the low critical switching current can be achieved for SyAF bilayers solely based on the magnetostatic coupling. In addition, the optimization of the end shape in free layers and the ratio of width to height of conducting lines can further reduce the critical switching current. PACS 75.50.Mg;75.40.Gb;75.60.Jk;85.75.Dd
Relation: 304(1), pp.e288-e290
Appears in Collections:[Institute of Optoelectronic Sciences] Periodical Articles

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