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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27496

Title: Imaging of Recording Marks and Their Jitters With Different Writing Strategy and Terminal Resistance of Optical Output
Authors: Cheng Hung Chu;Bau Jung Wu;Tsung Sheng Kao;Yuan Hsing Fu;Hai-Pang Chiang;Din Ping Tsai
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Conductive-atomic force microscopy (C-AFM);jitter;recording mark;writing strategy
Date: 2011-05
Issue Date: 2011-10-21T02:31:58Z
Publisher: IEEE Transactions on Magnetics
Abstract: Abstract:The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.
Relation: 45(5), pp.2221-2223
URI: http://ntour.ntou.edu.tw/handle/987654321/27496
Appears in Collections:[光電科學研究所] 期刊論文

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