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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27478

Title: High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths
Authors: Hai-Pang Chiang;Jing-Lun Lin;Railing Chang;Sheng-Yu Su;Pui Tak Leung
Contributors: NTOU:Institute of Optoelectronic Sciences
Date: 2005-10-15
Issue Date: 2011-10-21T02:31:55Z
Publisher: Optics Letters
Abstract: Abstract:It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9×10^−6 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.
Relation: 30(20), pp.2727-2729
URI: http://ntour.ntou.edu.tw/handle/987654321/27478
Appears in Collections:[光電科學研究所] 期刊論文

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