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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27477

Title: High resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengths
Authors: Hai-Pang Chiang;Jing-Lun Lin;Railing Chang;Zhi-Wei Chen;Pui Tak Leung
Contributors: NTOU:Institute of Optoelectronic Sciences
國立臺灣海洋大學:光電科學研究所
Keywords: Intergerometry;Surface plasmons;Phase measurement
Date: 2005-11-10
Issue Date: 2011-10-21T02:31:54Z
Publisher: Proc. SPIE 6002, Nanofabrication: Technologies, Devices, and Applications
Abstract: abstract:We have recently demonstrated that ultra high resolution of angular measurement down to 10-6 degree can be achieved via surface-plasmon-resonance heterodyne interferometry, in which the phase difference between p- and s- polarized reflected waves is monitored as a function of the incident angle. Here we give a brief summary of this technique and the rationale based on which such a measurement is possible. As a further study, we have also investigated, via simulation, how the change in environmental temperature will affect the resolution limit of this very versatile technique.
Relation: 6002(2), pp.600218-1-600218-10
URI: http://ntour.ntou.edu.tw/handle/987654321/27477
Appears in Collections:[光電科學研究所] 期刊論文

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