English  |  正體中文  |  简体中文  |  Items with full text/Total items : 26988/38789
Visitors : 2350013      Online Users : 27
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27477

Title: High resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengths
Authors: Hai-Pang Chiang;Jing-Lun Lin;Railing Chang;Zhi-Wei Chen;Pui Tak Leung
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Intergerometry;Surface plasmons;Phase measurement
Date: 2005-11-10
Issue Date: 2011-10-21T02:31:54Z
Publisher: Proc. SPIE 6002, Nanofabrication: Technologies, Devices, and Applications
Abstract: abstract:We have recently demonstrated that ultra high resolution of angular measurement down to 10-6 degree can be achieved via surface-plasmon-resonance heterodyne interferometry, in which the phase difference between p- and s- polarized reflected waves is monitored as a function of the incident angle. Here we give a brief summary of this technique and the rationale based on which such a measurement is possible. As a further study, we have also investigated, via simulation, how the change in environmental temperature will affect the resolution limit of this very versatile technique.
Relation: 6002(2), pp.600218-1-600218-10
URI: http://ntour.ntou.edu.tw/handle/987654321/27477
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback