English  |  正體中文  |  简体中文  |  Items with full text/Total items : 26988/38789
Visitors : 2349262      Online Users : 31
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/25474

Title: Distribution and contamination of trace metals in surface sediments of the East China Sea
Authors: Tien-Hsi Fang;Jou-Yun Li;Hui-Min Feng;ung-Yu Chen
Contributors: 國立臺灣海洋大學:海洋環境資訊系
Keywords: Continental shelf;East China Sea;Enrichment factor;Trace metals;Sediments;Sedimentation flux
Date: 2009-10
Issue Date: 2011-10-20T08:23:20Z
Publisher: Marine Environmental Research
Abstract: abstract:The distributions, contamination status and annual sedimentation flux of trace metals in surface sediments of the East China Sea (ECS) were studied. Higher concentrations of the studied metals were generally found in the inner shelf and the concentrations decreased seaward. The sequences of the enrichment factor (EF) of the studied metals are Cu > Mn > Ni > Zn > Pb > Fe. The values of EF suggest that the metals contamination in the middle and outer shelves of the ECS is still minor. The annual sedimentation fluxes of trace metals in the ECS were: Fe, 3.48 × 107 t/y; Mn, 9.07 × 105 t/y; Zn, 1.08 × 105 t/y; Ni, 4.48 × 104 t/y; Pb, 4.32 × 104 t/y and Cu, 3.1 × 104 t/y, respectively. Approximately 55–70% and 10–17% of the sedimentation fluxes of trace metals were deposited in the inner shelf and the Changjiang estuarine zone.
Relation: 68(4), pp.178–187
URI: http://ntour.ntou.edu.tw/handle/987654321/25474
Appears in Collections:[海洋環境資訊系] 期刊論文

Files in This Item:

There are no files associated with this item.



All items in NTOUR are protected by copyright, with all rights reserved.

 


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback