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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/25019

Title: Normalizing XRF-scanner data: A cautionary note on the interpretation of high-resolution records from organic-rich lakes
Authors: L. Löwemark;H.-F. Chen;T.-N. Yang;M. Kylander;E.-F. Yu;Y.-W. Hsu;T.-Q. Lee;S.-R. Song;S. Jarvis
Contributors: NTOU:Institute of Applied Geosciences
國立臺灣海洋大學:應用地球科學研究所
Keywords: XRF-scanning;Normalization;Lake sediment
Date: 2011-04-02
Issue Date: 2011-10-20T08:19:06Z
Publisher: Journal of Asian Earth Sciences
Abstract: abstract:X-ray fluorescence (XRF) scanning of unlithified, untreated sediment cores is becoming an increasingly common method used to obtain paleoproxy data from lake records. XRF-scanning is fast and delivers high-resolution records of relative variations in the elemental composition of the sediment. However, lake sediments display extreme variations in their organic matter content, which can vary from just a few percent to well over 50%. As XRF scanners are largely insensitive to organic material in the sediment, increasing levels of organic material effectively dilute those components that can be measured, such as the lithogenic material (the closed-sum effect). Consequently, in sediments with large variations in organic material, the measured variations in an element will to a large extent mirror the changes in organic material. It is therefore necessary to normalize the elements in the lithogenic component of the sediment against a conservative element to allow changes in the input of the elements to be addressed. In this study we show that Al, which is the lightest element that can be measured using the Itrax XRF-scanner, can be used to effectively normalize the elements of the lithogenic fraction of the sediment against variations in organic content. We also show that care must be taken when choosing resolution and exposure time to ensure optimal output from the measurements.
Relation: 40(6), pp.1250–1256
URI: http://ntour.ntou.edu.tw/handle/987654321/25019
Appears in Collections:[應用地球科學研究所] 期刊論文

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