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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/24526

Title: 時進正交相移法與五-相移法於電子斑點干涉術之設計與研究
The Design and Study of Combining ESPI with Time-Stepped Quadrature Phase Shifting and (5,1) Phase Shifting Technology
Authors: 李舒昇;王瀚威;曾緯哲;許義鴻;李世光
Shu-Sheng Lee;Han-Wei Wang;Eddie Tseng;Ii-Hung Hsu;Chih-Kung Lee
Contributors: NTOU:Department of Systems Engineering and Naval Architecture
Date: 2007-12-01
Issue Date: 2011-10-20T08:12:36Z
Publisher: 科儀新知
Abstract: Abstract:Electronic speckle pattern interferometry (ESPI) is a very common metrology for nondestructive testing. The resolution of ESPI is getting better as the optical image technology and the electric components improving. It is gradually applied to small specimen surface measurement within the microscopic system operating conditions. The major issue of ESPI is how to improve the measurement range. In order to solve this problem, the time-stepped quadrature phase shifting method was adopted as the phase unwrapping method in this research. For comparison, (5,1) phase shifting technology was also integrated to the ESPI system as the phase unwrapping method. It was proved that the timestepped quadrature phase shifting method built-in ESPI could successfully reconstructed the deformation of object which could not be solved by (5,1) phase shifting technology.
Relation: 161, pp.43-55
URI: http://ntour.ntou.edu.tw/handle/987654321/24526
Appears in Collections:[系統工程暨造船學系] 期刊論文

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