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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/23716

Title: X-ray reflectivity study of the structural characteristics of BaTiO3/LaNiO3 superlattice
Authors: Yuan-Chang Liang;Tai-Bor Wu;Hsin-Yi Lee;Heng-Jui Liu
Contributors: NTOU:Institute of Materials Engineering
Keywords: Sputtering;Surface structure;Interface;Superlattices
Date: 2004-12-22
Issue Date: 2011-10-20T08:07:27Z
Publisher: Thin Solid Films
Abstract: Abstract:An artificial superlattice of BaTiO3/LaNiO3 (BTO/LNO) was grown epitaxially on an Nb-doped SrTiO3 (001) single-crystalline substrate with a dual-gun rf magnetron sputtering system. The structuralcharacteristics of the superlattice films were studied mainly by X-rayreflectivity. Formation of a superlattice structure was confirmed from the appearance of Bragg peaks separated by Kiessig fringes in X-rayreflectivity curves and a crystal truncation rod (CTR) spectrum. The surface and interfacial roughness of the superlattice were derived from the fitted curves for specular reflectivity. A conformal relationship between consecutive BTO and LNO layers was observed from off-specular scattering. According to the fitted results and atomic-force microscopy images, the evolution of surface structure follows the Stranski–Krastanov (S–K) growth mode, in which the surface roughness increased with the thickening of sublayers.
Relation: 469-470, pp.500-504
URI: http://ntour.ntou.edu.tw/handle/987654321/23716
Appears in Collections:[材料工程研究所] 期刊論文

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