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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/23714

Title: Real-time x-ray study of roughness scaling in the initial growth of epitaxial BaTiO3/LaNiO3 superlattices
Authors: Yuan-Chang Liang;Hsin-Yi Lee;Heng-Jui Liu;Chun-Kai Huang;Tai-Bor Wu
Contributors: NTOU:Institute of Materials Engineering
Keywords: A1. Surface structure;A1. X-ray diffraction;A3. Superlattices
Date: 2005-05-15
Issue Date: 2011-10-20T08:07:26Z
Publisher: Journal of Crystal Growth
Abstract: Abstract:The evolution of surface and interface roughness during heteroepitaxial growth of strained BaTiO3/LaNiO3(BTO/LNO) superlattices on SrTiO3 (0 0 1) substrates was investigated using real-timeX-ray reflectivity measurements in situ with synchrotron radiation. The roughnessscaling of the growth front and interface of superlattices with modulation length below (2 and 6 nm) and beyond (20 nm) the critical thickness was studied against the bilayer number. The fitted results of in situ specular X-ray reflectivity curves reveal a two-dimensional growth of BTO and LNO sublayers on the SrTiO3 substrate for superlattices with a modulation length below the critical thickness. Moreover, a larger root-mean-square roughness of BTO/LNO interface was obtained in the superlattice with modulation length beyond the critical thickness indicating lattice relaxation in the superlattice structure. Fitted results of in situ specular X-ray reflectivity curves provide the first evidence for power-law scaling of the root-mean-square roughness of an interface and a surface in the superlattice structure. Observation of such a roughnessscaling behavior indicates that strain plays an important role in the determination of microstructure in the growth of epitaxial BTO/LNO superlattices.
Relation: 279(1-2), pp.114-121
URI: http://ntour.ntou.edu.tw/handle/987654321/23714
Appears in Collections:[材料工程研究所] 期刊論文

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